我是学计算机的，不太了解电子工程中的术语，请哪位打侠帮助解释一下，下面抄录STM32F103xx数据手册中关于EMC参数的说明与测试部分： EMC characteristics Susceptibility tests are performed on a sample basis during device characterization.
Functional EMS (electromagnetic susceptibility) While a simple application is executed on the device (toggling 2 LEDs through I/O ports). the device is stressed by two electromagnetic events until a failure occurs. The failure is indicated by the LEDs: Electrostatic discharge (ESD)(positive and negative) is applied to all device pins until a functional disturbance occurs. This test is compliant with the IEC 1000-4-2 standard. FTB:A Burst of Fast Transient voltage (positive and negative) is applied to VDD and VSS through a 100 pF capacitor, until a functional disturbance occurs. This test is compliant with the IEC 1000-4-4 standard.
A device reset allows normal operations to be resumed.
The test results are given in Table 29. They are based on the EMS levels and classes defined in application note AN1709.
Table 46. ADC accuracy - limited test conditions Symbol Parameter Typ Max Unit ET Total unadjusted error ±1.3 ±2 LSB
关键是，Test conditions为： fPCLK2 = 56 MHz, fADC = 14 MHz, RAIN < 10 kΩ, VDDA = 3 V to 3.6 V TA = 25 °C Measurements made after ADC calibration VREF+ = VDDA
Parameter Parameter Name Max Unit INL Integral nonlinearity ±2 LSB 所以只好使用软件来做平均： Integral nonlinearity with 8x software oversampling，得到 Max Unit ±1 LSB
新的Datasheet-LM3S2948.pdf
Parameter Parameter Name Max Unit INL Integral nonlinearity ±1 LSB
Luminary的ADC的优势是：还支持差分输入（Single-ended and differential-input configurations）
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