测试内存稳定性代码分享

Wince.Android

测试内存稳定性代码分享 [复制链接]

這種東西當然是要加在C:\WINCE600\PLATFORM\SMDKV210\SRC\BOOTLOADER\STEPLDR\main.c裡面 不然是要怎嚜測試整各DRAM void main(void) { Port_Init(); Led_Display_Off(1); //RED Led_Display_Off(2); //BLUE Led_Display_On(3);  //GREEN   if(!DRAM_Test()) {     Led_Display_On(1); //RED        RAM_Error(); } } BOOL DRAM_Test(void); unsigned long* DRAM_DeviceTest(unsigned long *BaseAddr, unsigned long nBytes); unsigned long* DRAM_AddrBusTest(unsigned long *BaseAddr, unsigned long nBytes); unsigned long  DRAM_DataBusTest(unsigned long *Addr);        //*---------------------------------------------------------------------------- //* \fn    DRAM_DataBusTest //* \brief Test the DRAM Data Bus //* return succeed return 0 / fail return Data Value //*---------------------------------------------------------------------------- unsigned long DRAM_DataBusTest(unsigned long *Addr) { unsigned long pattern; for(pattern = 1; pattern != 0; pattern <<= 1) { *Addr = pattern; Addr[1] = ~pattern; if(*Addr != pattern) return pattern; } return 0; } //*---------------------------------------------------------------------------- //* \fn    DRAM_AddrBusTest //* \brief Test the DRAM Address Bus //* return succeed return 0 / Fail return Error Address //* 測試區塊盡可能為２的次方 //*---------------------------------------------------------------------------- unsigned  long* DRAM_AddrBusTest(unsigned long *BaseAddr, unsigned long nBytes) { unsigned long offset,testOffset; unsigned long pattern = 0xAAAAAAAA; unsigned long antipattern = 0x55555555; unsigned long addressMask = (nBytes - 1)>>2; /*設定用來當成停止狀況,一次測試4個Bytes*/ for(offset = 4;(offset & addressMask) != 0; offset <<= 1) { BaseAddr[offset] = pattern; } /*檢查是否有其他位址線也出現1的訊號*/ BaseAddr[0] = antipattern; for(offset = 4;(offset & addressMask) != 0; offset <<= 1) { if(BaseAddr[offset] != pattern) return (unsigned long*) &BaseAddr[offset]; }        BaseAddr[0] = pattern; /*檢查是否有短路或誤接到低電位的位址線*/ for(testOffset = 4;(testOffset & addressMask) != 0; testOffset <<= 1) { BaseAddr[testOffset] = antipattern; for(offset = 4;(offset & addressMask) != 0; offset <<= 1) { if(BaseAddr[offset] != pattern && (offset != testOffset)) return (unsigned long*) &BaseAddr[testOffset]; } BaseAddr[testOffset] = pattern;        }        return 0; } //*---------------------------------------------------------------------------- //* \fn    DRAM_DeviceTest //* \brief Test the DRAM //*---------------------------------------------------------------------------- unsigned long* DRAM_DeviceTest(unsigned long *BaseAddr, unsigned long nBytes) { unsigned long offset; unsigned long nDWords = nBytes/4; unsigned long pattern=0xAAAAAAAA; unsigned long antipattern=0x55555555; /*        //將整個記憶體填入已知的資料數值 for(offset = 0;offset < nDWords; offset++) { BaseAddr[offset] = pattern; if(offset % 0x100000 == 0) DebugString(".");        } //確認每個位址上的資料，並將他反向，作第二回合測試 for(offset = 0;offset < nDWords;offset++) { if(BaseAddr[offset] != pattern) { return (unsigned long*)&BaseAddr[offset]; } BaseAddr[offset] = antipattern;        if(offset % 0x100000 == 0) DebugString(".");        } //確認每個位址上的資料是否被反向，然後歸0 for(pattern = 1,offset = 0;offset < nDWords; pattern++,offset++) { if(BaseAddr[offset] != antipattern) {        return (unsigned long*)&BaseAddr[offset]; } BaseAddr[offset] = 0; if(offset % 0x100000 == 0) DebugString(".");        } DebugString("\n"); */            //確認Data Bus ok BaseAddr[0] = pattern;     if(BaseAddr[0] != pattern) { return (unsigned long*)&BaseAddr[0]; } BaseAddr[0] = antipattern;            if(BaseAddr[0] != antipattern) { return (unsigned long*)&BaseAddr[0]; } /* //確認Address Bus ok for(offset = 0;offset < nDWords;) //offset++ {     BaseAddr[offset] = pattern;     offset++;     BaseAddr[offset] = antipattern;     if(BaseAddr[offset] != antipattern || BaseAddr[offset-1] != pattern) { return (unsigned long*)&BaseAddr[offset]; }                             offset++; } */ return 0; } //*---------------------------------------------------------------------------- //* \fn    DRAM_Test //* \brief Test All the DRAM: Data/Address/Every Bit //*---------------------------------------------------------------------------- BOOL DRAM_Test(void) { unsigned long Value; unsigned long *pValue; unsigned long DRAM0_BASE = 0x20000000;        unsigned long DRAM0_SIZE =  0x8000000; //128M unsigned long DRAM1_BASE = 0x40000000;        unsigned long DRAM1_SIZE =  0x8000000; //128M ////////////////////////////////////////////////////////////////////////////// Value = DRAM_DataBusTest((unsigned long *)DRAM1_BASE); if(Value != 0) { //DebugString("DRAM1 Data Bus Error\n"); return FALSE; } pValue = DRAM_AddrBusTest((unsigned long *)DRAM1_BASE,DRAM1_SIZE); if(pValue != 0) { //DebugString("DRAM1 Address Bus Error\n");        return FALSE; } pValue = DRAM_DeviceTest((unsigned long *)DRAM1_BASE,DRAM1_SIZE); if(pValue != 0) { //DebugString("DRAM1 Device Error\n"); return FALSE; } ////////////////////////////////////////////////////////////////////////////// Value = DRAM_DataBusTest((unsigned long *)DRAM0_BASE); if(Value != 0) { //DebugString("DRAM0 Data Bus Error\n"); return FALSE; } pValue = DRAM_AddrBusTest((unsigned long *)DRAM0_BASE,DRAM0_SIZE); if(pValue != 0) { //DebugString("DRAM0 Address Bus Error\n");        return FALSE; } pValue = DRAM_DeviceTest((unsigned long *)DRAM0_BASE,DRAM0_SIZE); if(pValue != 0) { //DebugString("DRAM0 Device Error\n"); return FALSE; } //////////////////////////////////////////////////////////////////////////////   return TRUE;        }