C2000 launchpad无法连接目标板，求帮助

7leaves

C2000 launchpad无法连接目标板，求帮助 [复制链接]

选择仿真器并测试，出错：

测试结果如下：
[Start]

Execute the command:

%ccs_base%/common/uscif/dbgjtag -f %boarddatafile% -rv -o -F inform,logfile=yes -S pathlength -S integrity

[Result]


-----[Print the board config pathname(s)]------------------------------------

C:\Users\ADMINI~1\AppData\Local\.TI\302700942\
    0\0\BrdDat\testBoard.dat

-----[Print the reset-command software log-file]-----------------------------

This utility has selected a 100- or 510-class product.
This utility will load the adapter 'jioserdesusb.dll'.
The library build date was 'Oct 29 2012'.
The library build time was '14:44:30'.
The library package version is '5.0.899.0'.
The library component version is '35.34.40.0'.
The controller does not use a programmable FPGA.
The controller has a version number of '4' (0x00000004).
The controller has an insertion length of '0' (0x00000000).
This utility will attempt to reset the controller.
This utility has successfully reset the controller.

-----[Print the reset-command hardware log-file]-----------------------------

The scan-path will be reset by toggling the JTAG TRST signal.
The controller is the FTDI FT2232 with USB interface.
The link from controller to target is direct (without cable).
The software is configured for FTDI FT2232 features.
The controller cannot monitor the value on the EMU[0] pin.
The controller cannot monitor the value on the EMU[1] pin.
The controller cannot control the timing on output pins.
The controller cannot control the timing on input pins.
The scan-path link-delay has been set to exactly '0' (0x0000).

-----[The log-file for the JTAG TCLK output generated from the PLL]----------

There is no hardware for programming the JTAG TCLK frequency.

-----[Measure the source and frequency of the final JTAG TCLKR input]--------

There is no hardware for measuring the JTAG TCLK frequency.

-----[Perform the standard path-length test on the JTAG IR and DR]-----------

This path-length test uses blocks of 512 32-bit words.

The test for the JTAG IR instruction path-length failed.
The JTAG IR instruction scan-path is stuck-at-ones.

The test for the JTAG DR bypass path-length failed.
The JTAG DR bypass scan-path is stuck-at-ones.

-----[Perform the Integrity scan-test on the JTAG IR]------------------------

This test will use blocks of 512 32-bit words.
This test will be applied just once.

Do a test using 0xFFFFFFFF.
Scan tests: 1, skipped: 0, failed: 0
Do a test using 0x00000000.
Test 2 Word 0: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
Test 2 Word 1: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
Test 2 Word 2: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
Test 2 Word 3: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
Test 2 Word 4: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
Test 2 Word 5: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
Test 2 Word 6: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
Test 2 Word 7: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
The details of the first 8 errors have been provided.
The utility will now report only the count of failed tests.
Scan tests: 2, skipped: 0, failed: 1
Do a test using 0xFE03E0E2.
Scan tests: 3, skipped: 0, failed: 2
Do a test using 0x01FC1F1D.
Scan tests: 4, skipped: 0, failed: 3
Do a test using 0x5533CCAA.
Scan tests: 5, skipped: 0, failed: 4
Do a test using 0xAACC3355.
Scan tests: 6, skipped: 0, failed: 5
Some of the values were corrupted - 83.3 percent.


The JTAG IR Integrity scan-test has failed.

-----[Perform the Integrity scan-test on the JTAG DR]------------------------

This test will use blocks of 512 32-bit words.
This test will be applied just once.

Do a test using 0xFFFFFFFF.
Scan tests: 1, skipped: 0, failed: 0
Do a test using 0x00000000.
Test 2 Word 0: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
Test 2 Word 1: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
Test 2 Word 2: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
Test 2 Word 3: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
Test 2 Word 4: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
Test 2 Word 5: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
Test 2 Word 6: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
Test 2 Word 7: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
The details of the first 8 errors have been provided.
The utility will now report only the count of failed tests.
Scan tests: 2, skipped: 0, failed: 1
Do a test using 0xFE03E0E2.
Scan tests: 3, skipped: 0, failed: 2
Do a test using 0x01FC1F1D.
Scan tests: 4, skipped: 0, failed: 3
Do a test using 0x5533CCAA.
Scan tests: 5, skipped: 0, failed: 4
Do a test using 0xAACC3355.
Scan tests: 6, skipped: 0, failed: 5
Some of the values were corrupted - 83.3 percent.


The JTAG DR Integrity scan-test has failed.

[End]



debug时显示无法连接：


[ 本帖最后由 7leaves 于 2012-12-10 21:27 编辑 ]

dontium

一、  不接 C2000 launchpad时，是以下情况：


[Start]
Execute the command:
%ccs_base%/common/uscif/dbgjtag -f %boarddatafile% -rv -o -F inform,logfile=yes -S pathlength -S integrity
[Result]

-----[Print the board config pathname(s)]------------------------------------
C:\DOCUME~1\ADMINI~1\LOCALS~1\APPLIC~1\.TI\
    213602635\0\0\BrdDat\testBoard.dat
-----[Print the reset-command software log-file]-----------------------------
This utility has selected a 100- or 510-class product.
This utility will load the adapter 'jioserdesusb.dll'.
An error occurred while soft opening the controller.
-----[An error has occurred and this utility has aborted]--------------------
This error is generated by TI's USCIF driver or utilities.
The value is '-151' (0xffffff69).
The title is 'SC_ERR_FTDI_OPEN'.
The explanation is:
One of the FTDI driver functions used during
the connect returned bad status or an error.
The cause may one or more of: invalid emulator serial number,
blank emulator EEPROM, missing FTDI drivers, faulty USB cable.
Use the xds100serial command-line utility in the 'common/uscif'
folder to verify the emulator can be located.
[End]


二、把 C2000 launchpad上的3.3V插针去掉时，和楼主的现象一样：

[Start]
Execute the command:
%ccs_base%/common/uscif/dbgjtag -f %boarddatafile% -rv -o -F inform,logfile=yes -S pathlength -S integrity
[Result]

-----[Print the board config pathname(s)]------------------------------------
C:\DOCUME~1\ADMINI~1\LOCALS~1\APPLIC~1\.TI\
    213602635\0\0\BrdDat\testBoard.dat
-----[Print the reset-command software log-file]-----------------------------
This utility has selected a 100- or 510-class product.
This utility will load the adapter 'jioserdesusb.dll'.
The library build date was 'May 30 2012'.
The library build time was '22:52:27'.
The library package version is '5.0.747.0'.
The library component version is '35.34.40.0'.
The controller does not use a programmable FPGA.
The controller has a version number of '4' (0x00000004).
The controller has an insertion length of '0' (0x00000000).
This utility will attempt to reset the controller.
This utility has successfully reset the controller.
-----[Print the reset-command hardware log-file]-----------------------------
The scan-path will be reset by toggling the JTAG TRST signal.
The controller is the FTDI FT2232 with USB interface.
The link from controller to target is direct (without cable).
The software is configured for FTDI FT2232 features.
The controller cannot monitor the value on the EMU[0] pin.
The controller cannot monitor the value on the EMU[1] pin.
The controller cannot control the timing on output pins.
The controller cannot control the timing on input pins.
The scan-path link-delay has been set to exactly '0' (0x0000).
-----[The log-file for the JTAG TCLK output generated from the PLL]----------
There is no hardware for programming the JTAG TCLK frequency.
-----[Measure the source and frequency of the final JTAG TCLKR input]--------
There is no hardware for measuring the JTAG TCLK frequency.
-----[Perform the standard path-length test on the JTAG IR and DR]-----------
This path-length test uses blocks of 512 32-bit words.
The test for the JTAG IR instruction path-length failed.
The JTAG IR instruction scan-path is stuck-at-ones.
The test for the JTAG DR bypass path-length failed.
The JTAG DR bypass scan-path is stuck-at-ones.
-----[Perform the Integrity scan-test on the JTAG IR]------------------------
This test will use blocks of 512 32-bit words.
This test will be applied just once.
Do a test using 0xFFFFFFFF.
Scan tests: 1, skipped: 0, failed: 0
Do a test using 0x00000000.
Test 2 Word 0: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
Test 2 Word 1: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
Test 2 Word 2: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
Test 2 Word 3: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
Test 2 Word 4: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
Test 2 Word 5: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
Test 2 Word 6: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
Test 2 Word 7: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
The details of the first 8 errors have been provided.
The utility will now report only the count of failed tests.
Scan tests: 2, skipped: 0, failed: 1
Do a test using 0xFE03E0E2.
Scan tests: 3, skipped: 0, failed: 2
Do a test using 0x01FC1F1D.
Scan tests: 4, skipped: 0, failed: 3
Do a test using 0x5533CCAA.
Scan tests: 5, skipped: 0, failed: 4
Do a test using 0xAACC3355.
Scan tests: 6, skipped: 0, failed: 5
Some of the values were corrupted - 83.3 percent.
The JTAG IR Integrity scan-test has failed.
-----[Perform the Integrity scan-test on the JTAG DR]------------------------
This test will use blocks of 512 32-bit words.
This test will be applied just once.
Do a test using 0xFFFFFFFF.
Scan tests: 1, skipped: 0, failed: 0
Do a test using 0x00000000.
Test 2 Word 0: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
Test 2 Word 1: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
Test 2 Word 2: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
Test 2 Word 3: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
Test 2 Word 4: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
Test 2 Word 5: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
Test 2 Word 6: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
Test 2 Word 7: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
The details of the first 8 errors have been provided.
The utility will now report only the count of failed tests.
Scan tests: 2, skipped: 0, failed: 1
Do a test using 0xFE03E0E2.
Scan tests: 3, skipped: 0, failed: 2
Do a test using 0x01FC1F1D.
Scan tests: 4, skipped: 0, failed: 3
Do a test using 0x5533CCAA.
Scan tests: 5, skipped: 0, failed: 4
Do a test using 0xAACC3355.
Scan tests: 6, skipped: 0, failed: 5
Some of the values were corrupted - 83.3 percent.
The JTAG DR Integrity scan-test has failed.
[End]

dontium

这种情况一般是F28027没有工作所致，
但TI的原装 launchpad，板子应该是没问题的，所以，检查一下看看三点三伏供电是否正常

7leaves

偶尔好使，又提示芯片工作在low-power mode，
然后还有出现：
C28xx: Flash Programmer: Error erasing flash memory. Device is locked or not connected. Operation cancelled
C28xx: Flash Programmer: Error erasing Flash memory.
C28xx: Flash Programmer: Device is locked or not connected. Operation cancelled.
C28xx: Trouble Writing Memory Block at 0x3f3a05 on Page 0 of Length 0x81
C28xx: GEL: File: H:\Documents\workspace\eeworld\Debug\eeworld.out: Load failed.

dontium

你看看是不是接电源的地方有接触不良现象？

安_然

建议初玩者不要直接下程序进flash，先在ram里跑跑

7leaves

如果烧写过程中动数据线了，导致烧写未完成，会造成芯片锁死吧，这时候还能连接上板子么？会不会就是我这个样子，这块芯片是彻底废了，还是说能干点别的

dontium

虽然锁了，但还可以在RAM中调试，不影响你搞个小程序玩玩。

锁死后的解锁，本版块过去有帖子论述，你找一下

7leaves

但是锁了会影响连接板子么，可总是链接不上又是哪里的问题呢

dontium

板子的连接是不受影响的。

7leaves

那就奇怪了，我先说下现在的情况，3.3V跳冒接着的时候是无法连接的，如一楼的错误，这时我拔下来再装上，可以连上了（很奇怪），这时debug（我用的官方的例程，应该没错误），出现以下错误。回不是芯片有问题，或者电源，而且"0x3ff7bf" 怎么会无有效数据？
C28xx: Flash Programmer: Warning: The configured device (TMS320F28027), does not match the detected device (). Flash Programming operations could be affected. Please consider modifying your target configuration file.
C28xx: GEL Output:
Device Calibration not complete, check if device is unlocked and recalibrate.C28xx: GEL Output:
Device Calibration not complete, check if device is unlocked and recalibrate.C28xx: GEL Output:
Device Calibration not complete, check if device is unlocked and recalibrate.C28xx: Can't Run Target CPU: (Error -1156 @ 0x0) Device may be operating in low-power mode. Do you want to bring it out of this mode? (Emulation package 5.0.899.0)
C28xx: Can't Run Target CPU: (Error -2060 @ 0x0) Requested operation cannot be done while device is running. Halt the device, and retry the operation. (Emulation package 5.0.899.0)
C28xx: Trouble Halting Target CPU: (Error -1135 @ 0x0) The emulator reported an error. Confirm emulator configuration and connections, reset the emulator, and retry the operation. (Emulation package 5.0.899.0)
C28xx: Error: (Error -1135 @ 0x0) The emulator reported an error. Confirm emulator configuration and connections, reset the emulator, and retry the operation. (Emulation package 5.0.899.0)
C28xx: Failed to remove the debug state from the target before disconnecting.  There may still be breakpoint op-codes embedded in program memory.  It is recommended that you reset the emulator before you connect and reload your program before you continue debugging

C28xx: GEL Output:
Device Calibration not complete, check if device is unlocked and recalibrate.



[ 本帖最后由 7leaves 于 2012-12-12 10:57 编辑 ]

7leaves

我就很奇怪，既然被锁了也能调试，但现在的状况很费解啊，主要的错误有以下先是连接目标板经常连不上，然后是debug时会提示是否从low-power模式下退出，再然后就是说让查询是否unlock或者仿真器配置问题

dontium

照三楼做一做

安_然

供电不稳

龙广

我也出现上面的问题了，求解答

lawernce67

Error connecting to the target:
(Error -1041 @ 0x0)
The emulator reported an error. Confirm emulator configuration and connections, reset the emulator, and retry the operation.
(Emulation package 5.0.747.0)
不知如何是好 ....

lanmanck

建议大家不要用TI，他的jtag真tmd难用！那么多线，没有类似stm32utility的程序测试，真是反人类设计！